Ukraine Trade Data of Ceramic Base Imports Under HS Code 85
Lookup Ukraine trade data of ceramic base imports under HS code 85. Check Ukraine import trading parters of ceramic base
5 Shipments Records (Demo)
85 
| Date | HS Code | Product Description | Origin Country | Quantity | Unit | Net Weight | Total Value [USD] | Importer Name | Click to view 16 more columns 16 More Columns Available |
|---|---|---|---|---|---|---|---|---|---|
| 27/Apr/2017 | 8531809590 | 1.prystroyi-based solar cells.�signaling traffic based on infrared radiation, designed to enable / disable ventilation equipment when motion is detected in the room.�voltage 15v post.napr. (47kom): art.re200b-ww-p -6000shttorhovelna mark ceramickrayina production phvyrobnyk nippon nippon ceramic co., ltd. | N/A | ****** | UA100230 | 8.50 | 3,900.00 | ***** | 16 More Columns Available along with Company Name and Other Details etc. |
| 25/Apr/2017 | 8533401000 | "1.rezystory planar alternating electrical resistance (potentiometers or trimmer) otovi mineral resources, capacity 0, 125vt: -3313j-1-501e- 200 pieces; marking: 3313j-1 resistance - 0, 5 kom; velektropryladah used. potentiometers made by drawing carts vuhilnoyidorizhky ceramic-based, and on which the moving ruhomyyelement adapts to select the desired mark oporu.torhova: "" bourns "" company manufacturer: "" bourns inc. "" china / cn.. " | N/A | ****** | UA403030 | 0.04 | 40.89 | ***** | |
| 24/Apr/2017 | 8506101100 | "1.raster electron microscope jsm-��t300lv (in a disassembled state) -1 pieces (microscope jsm-��t300lv is a raster electronic microscope with the ability to work in a low-volume environment. raster optical is the formation of images from individual elements by combining different transparent and non transparent lacquer ( raster), converting directed beams of rays.raster electron microscope consists of the following main nodes: -electron gun, emitting electrons; -console with a column and a vacuum system-an electron-optic system forming an electronics�throne bundle and providing scanning on the surface of the image (personal computer, liquid crystal display), an external control interface, internal control software, a control module, an image module, a sample chamber, a side camera for examining a sample camera, - a gateway control system, a gateway cameras; -vacuum chamber; -detector of secondary electrons for low-vacuum mode and a current-beam detector; -energidessersion spectrometers; vds spectrometer (turret up to 6 crystals); -crystals, diaphragms, seals, rubber�caps to goggles, adapters, and other kabelizhyvlennya flexible svitlovid set standards, an additional lens cathodes; -stil operator.�the microscope is equipped with a convenient and easy to use interface.�it has a high performance due to high-speed switching and control capabilities via the touch screen as an addition to high-quality electron optics with an advanced vacuum vacuuming system and system capture and image construction.characteristics: type of source of electrons // cathode of direct tungsten tungsten;�low-volume mode // from 10 to 650 pa. spatial differentiation // 3 nm at 30kv, 15nm at 1kv;�spatial differentiation in low-vacuum in the mode // 4nm;�the energy of electron beam // from 300 ev to 30 kev;�increase // from 5 to 300000 times on a print format of 10x15cm;�i am going through the jet // from 1pa to 1�a;�maximum sample size // 20mm in diameter and 80mm in thickness;�sample table // eucentric, motorized torsional (five) cordate, with a range travel of x-125mm, y-100mm, z-80mm, inclination of 10 to 90graduses, rotation-360 degrees without stop;�suction vacuum vacuum turbomolecular pump, for vacuum pumps;�sysculate // option.�the microscope is based on the use of a pre-formed fine electronic ray (probe), whose position is controlled by electromagnetic fields.�under the influence of beam electrons there is a series of processes characteristic of this material and its structure.these include scattered primitive electrons, emission (emission) of secondary electrons, the appearance ofelectrons, passed through the object (in the case of thin objects), the extinction of the characteristic radiation.�appointment of a microscope: - obtaining an image of a surface with a nanometer resolution; - local determination of the contents of a wide range of chemical compounds and materials (ceramics, alloys, polymers). software: microscope management is carried out " | CHINA | 74,416 | UA100120 | 1,580.23 | 8,037.96 | ***** | |
| 24/Apr/2017 | 8544300098 | "1.polovyy spar, natrievyy crushed, vy base, crude, stamps; f501 e-10 crudesodium feldspar-2000000kh. raw (not waste) are using for production of ceramic tiles. (mass fraction sio2-70, 05%; al2o3 -18, 02%; fe2o3-0, 12%; tio2-0, 31%; cao-0, 95%; mgo-0, 13%; k2o-0, 36%; na2o-9, 72%; loi- 0.32%. (notcontains dorohotsinoho stones (diamonds)) (without packaging bulk) manufacturer: esan eczacibasitorhivelna mark eczacibasikrayina production: tr. " | ITALY | ****** | UA110190 | 0.03 | 53.67 | ***** | |
| 19/Apr/2017 | 8546200090 | 1.izolyatory elektrichni: insulator bylt.757513.009 - 150sht.�izolyatorbylt.757513.003 - 3500sht.�electrical insulators are made of steatite c-220 -steatytovoyi ceramics (based on talc, clay, potassium carbonate and barium andorganic plasticizers) .bez metal insulator cp 238/63 -uhl2 (4690) - 200sht.�host13871-78.�electrical insulators are made of kordyyerytu c-410 -kordyyerytovoyi ceramics (based malozalizystoho talc, technical and okysyalyuminiyu vysokoplastychnoyi ▪ fire-resistant clay).�without chastyn.pryznacheni metal for use in electrical apparatus to mark teplovoziv.torhovelna not danyh.vyrobnyk: steatit srokrayina production: cz.�. | CZECH REPUBLIC | ****** | UA807170 | 206.27 | 2,042.40 | ***** |
