Slovenia Trade Statistics of Particulate Imports | Slovenia Import Data of Particulate

Get latest 2017 Slovenia trade statistics of particulate imports. Slovenia import data covers hs code, particulate price, quantity, all trading partners etc.

Slovenia Import Statistics of Particulate | Slovenia Trade Data of Particulate Imports

Lookup Slovenia import statistics of particulate. Check Slovenia trade data of particulate imports with name of origin and destination country.
 
 
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6 Records (Demo)

Import Shipment Records Found

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DateHS CodeProduct DescriptionExporter CountryQuantity [KGS]Total Value [USD]
Dec/201490319020PARTS AND ACCESSORIES FOR OPTICAL INSTRUMENTS AND APPLIANCES FOR INSPECTING SEMICONDUCTOR WAFERS OR DEVICES OR FOR INSPECTING PHOTOMASKS OR RETICLES USED IN MANUFACTURING SEMICONDUCTOR DEVICES OR FOR MEASURING SURFACE PARTICULATE CONTAMINATION ON SEMICONDFrance04389.836 10 More Columns Available
Dec/201490319020PARTS AND ACCESSORIES FOR OPTICAL INSTRUMENTS AND APPLIANCES FOR INSPECTING SEMICONDUCTOR WAFERS OR DEVICES OR FOR INSPECTING PHOTOMASKS OR RETICLES USED IN MANUFACTURING SEMICONDUCTOR DEVICES OR FOR MEASURING SURFACE PARTICULATE CONTAMINATION ON SEMICONDFr Germany05622.936
Dec/201490319020PARTS AND ACCESSORIES FOR OPTICAL INSTRUMENTS AND APPLIANCES FOR INSPECTING SEMICONDUCTOR WAFERS OR DEVICES OR FOR INSPECTING PHOTOMASKS OR RETICLES USED IN MANUFACTURING SEMICONDUCTOR DEVICES OR FOR MEASURING SURFACE PARTICULATE CONTAMINATION ON SEMICONDItaly011652.795
Dec/201490319020PARTS AND ACCESSORIES FOR OPTICAL INSTRUMENTS AND APPLIANCES FOR INSPECTING SEMICONDUCTOR WAFERS OR DEVICES OR FOR INSPECTING PHOTOMASKS OR RETICLES USED IN MANUFACTURING SEMICONDUCTOR DEVICES OR FOR MEASURING SURFACE PARTICULATE CONTAMINATION ON SEMICONDUtd. Kingdom0110.979
Dec/201490319020PARTS AND ACCESSORIES FOR OPTICAL INSTRUMENTS AND APPLIANCES FOR INSPECTING SEMICONDUCTOR WAFERS OR DEVICES OR FOR INSPECTING PHOTOMASKS OR RETICLES USED IN MANUFACTURING SEMICONDUCTOR DEVICES OR FOR MEASURING SURFACE PARTICULATE CONTAMINATION ON SEMICONDDenmark02737.482
Dec/201490319020PARTS AND ACCESSORIES FOR OPTICAL INSTRUMENTS AND APPLIANCES FOR INSPECTING SEMICONDUCTOR WAFERS OR DEVICES OR FOR INSPECTING PHOTOMASKS OR RETICLES USED IN MANUFACTURING SEMICONDUCTOR DEVICES OR FOR MEASURING SURFACE PARTICULATE CONTAMINATION ON SEMICONDEuropean Union024501.697
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